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Near field diffraction analysis and simulate about nanascale of Fresnel zone plate

机译:近场衍射分析与菲涅耳区板纳瓦莱近衍射分析及模拟

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In this paper, we calculated the numeric results of diffraction field in space of X-ray (λ=4.5nm) Fresnel zone plate based on angular spectrum method, analyzed the axial and radial distribution patterns of X-ray Fresnel zone plate. The Full Width at Half-Maximum (FWHM), Depth Of Focus (DOF) and Strehl efficiency of focus spot were studied. Discussed the relationships between FPZ's design parameter and focus spot properties. At the condition of λ=4.5nm and the outmost width Wn=50nm, the size of focus spot is proportional to the outmost width, and increase slowly with the increase of number of zones and focus length; the DOF of focus spot increase at first; when the focus length increased to 40μm, the DOF incline to a constant; the focus spot's Strehl efficiency increased slowly with the increase of number of zones and focus length.
机译:在本文中,基于角谱法计算X射线(λ= 4.5nm)菲涅耳区板空间中衍射场的数值结果,分析了X射线菲涅耳区板的轴向和径向分布图。研究了半最大(FWHM),对焦深度(DOF)和焦点效率的全宽。讨论了FPZ设计参数与焦点属性之间的关系。在λ= 4.5nm和最外径的宽度Wn = 50nm的条件下,聚焦点的尺寸与最外径成比例,并且随着区域数量和聚焦长度的增加而缓慢增加;焦点的DOF起初增加;当聚焦长度增加到40μm时,DOF倾斜至恒定;随着区域数量和焦距的增加,聚焦点的施力效率缓慢增加。

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