Advanced DFT Features for an Industrial Application SoC

摘要

With the development of process technologies and increased complexity of chips, SoC (System-on-Chip) testing becomes more and more difficult. Traditional testing methods cannot meet the current design requirements anymore. In this paper, we present a DFT (design-for-testability) scheme for an industrial application SoC chip basing on SMIC 130nm CMOS technology, it includes boundary scan test, memory BIST (built-in self-test), at-speed scan testing and parameter testing. Experimental results demonstrate that the proposed technique can gain high fault coverage and test compression ratio, which are 97.39% and 30%, satisfying the project demands.