Fabrication of integrated active devices is being subject of intense research. In this communication, we present a vertical microcavity fabricated by the Aerosol-gel process. It is composed of a half-wave Y{sub}(2-x)Er{sub}xTi{sub}2O{sub}7 (YETO) active layer sandwiched between two dielectric Bragg mirrors. These latters are elaborated by alternatively depositing SiO{sub}2 and TiO{sub}2 quarter-wave layers. As these materials exhibit a relatively large index contrast (Δn = 0.9), high reflecting
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