Due to the transition of the electronics industry to lead-free solders, the issue of tin (Sn) whisker has become one of the most imperative issues that need to be resolved. Moreover, with the increasing demand for electronics miniaturization, Sn whisker growth is a severe threat to the reliability of microelectronic devices. Sn whisker is a conductive tin structure that grows spontaneously from tin finished surfaces, which can lead to well-documented system failures in electronics industries. Assessment of the Sn whisker growth is difficult because of the slow and unpredictable nature of the Sn whisker formation. This paper presents the results of morphology analysis of Sn whisker growth in terms of Sn whiskers shape, average density and maximum length of Sn whisker on Sn-Cu solder finished using scanning electron microscope (SEM). Micro-indentation test was used to accelerate the growth of Sn whisker at room temperature storage.
展开▼
