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The Effect of deposition times on preparation of SnO2:F conductive glass by Indonesian local stannic chloride precursors

机译:沉积时间对印度尼西亚局部亚烷氯前体制备SnO2:F导电玻璃的影响

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The performance of fluorine-doped tin oxide (FTO) as an alternative semiconductor besides indium tin oxide (ITO) has been investigated. Currently, the precursors often used in the manufacture of fluorine-doped tin oxide (FTO) are commercial precursors on the market. In the present work, a thin film FTO will be fabricated using a pyrolysis spray technique with an ultrasonic nebulizer using Indonesian local precursors of stannic chloride with the variation of deposition times (5, 10, 15, 20 and 25 minus). Thin films were characterized by using x-ray diffraction (XRD), scanning electron microscope (SEM), ultraviolet-visible (UV-Vis) spectroscopy, and four-point probes. The optimum result obtained by pyrolysis technique with a deposition time of 20 minutes and substrate temperature at 300 °C has a resistivity of 1.059 x 10~(-4) Ω.cm and transmittance 89.614%. Fluorine-doped tin oxide (FTO) fabricated by using these local Indonesian precursors promise for further development as a glass of dye-sensitized solar cells (DSSC).
机译:研究了除氧化铟锡(ITO)之外作为替代半导体的氟掺杂氧化锡(FTO)的性能。目前,通常用于制造氟掺杂的氧化锡(FTO)的前体是市场上的商业前体。在本作工作中,使用具有超声波雾化器的热解喷雾技术,使用印度尼西亚局部前体的沉积时间(5,10,15,20和25减去)制造薄膜FTO。通过使用X射线衍射(XRD),扫描电子显微镜(SEM),紫外 - 可见(UV-VIS)光谱,和四点探针薄膜进行了表征。通过20分钟沉积时间和300℃的底物温度的热解技术获得的最佳结果,电阻率为1.059×10〜(-4)Ω.cm和透射率89.614%。氟掺杂的氧化锡(FTO)制造通过使用这些本地印度尼西亚前体用于进一步开发作为染料敏化太阳能电池(DSSC)的玻璃保证。

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