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Millimeter wave imaging: a historical review

机译:毫米波成像:历史评论

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摘要

The SPIE Passive and Active Millimeter Wave Imaging conference has provided an annual focus and forum for practitioners in the field of millimeter wave imaging for the past two decades. To celebrate the conference's twentieth anniversary we present a historical review of the evolution of millimeter wave imaging over the past twenty years. Advances in device technology play a fundamental role in imaging capability whilst system architectures have also evolved. Imaging phenomenology continues to be a crucial topic underpinning the deployment of millimeter wave imaging in diverse applications such as security, remote sensing, non-destructive testing and synthetic vision.
机译:Spie被动和活跃的毫米波成像会议为过去二十年来提供了一年一度的焦点和从业者的从业者,这是过去二十年的毫米波成像领域。为了庆祝会议的二十周年,我们在过去二十年中展示了对毫米波成像的演变的历史审查。设备技术的进步在成像能力中发挥着基本作用,而系统架构也在演变。成像现象学仍然是支撑在不同应用中毫米波成像的关键主题,如安全性,遥感,非破坏性测试和合成视觉等多种应用。

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