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Millimeter wave imaging: a historical review

机译:毫米波成像:历史回顾

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The SPIE Passive and Active Millimeter Wave Imaging conference has provided an annual focus and forum for practitioners in the field of millimeter wave imaging for the past two decades. To celebrate the conference's twentieth anniversary we present a historical review of the evolution of millimeter wave imaging over the past twenty years. Advances in device technology play a fundamental role in imaging capability whilst system architectures have also evolved. Imaging phenomenology continues to be a crucial topic underpinning the deployment of millimeter wave imaging in diverse applications such as security, remote sensing, non-destructive testing and synthetic vision.
机译:在过去的二十年中,SPIE被动和主动毫米波成像会议为毫米波成像领域的从业人员提供了年度焦点和论坛。为了庆祝大会成立二十周年,我们对过去20年来毫米波成像的发展进行了历史回顾。设备技术的进步在成像能力方面起着根本性的作用,而系统架构也在不断发展。成像现象学仍然是至关重要的主题,是毫米波成像在各种应用(例如安全性,遥感,无损检测和合成视觉)中的部署的基础。

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