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Defects detection in laminated and Soft Magnetic Composites devices with a novel thermographic method

机译:具有新型热敏法的层压和软磁复合材料装置中的缺陷检测

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The realization of electromagnetic devices may implies the presence of local losses caused by material defects or by magnetic anomalies caused by mechanical processing. The problem of such defects location is the object of the present work; the aim of obtaining information about imperfections or defects with a non invasive inspection has been pursued. The adopted approach is based on the observation of the device under test with a particular thermographic camera; no limitations in size and shapes devices are considered and the method can be widely adopted. Examples of defects in the magnetic circuit realization are described, both for traditional ferromagnetic laminated sheets and for Soft Magnetic Composites.
机译:电磁器件的实现可以意味着由材料缺陷或由机械加工引起的磁异常引起的局部损失的存在。这种缺陷位置的问题是目前工作的目的;已经追求获得有关不完美检查的缺陷或缺陷的信息。采用的方法是基于用特定的热量摄像机进行测试的检测;考虑尺寸和形状器件的局限性没有限制,并且可以广泛采用该方法。描述了磁路实现中的缺陷的实例,用于传统的铁磁层压板和软磁复合材料。

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