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Phase Shifting Interferometry Using a Coupled Cyclic Path Interferometers

机译:使用耦合的循环路径干涉仪相移干涉测量法

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In this research we implemented a two-step phase shifting system based on two cyclic-path coupled interferometers for slope measurements of transparent samples. The optical system generates two π-shifted interferograms, and the phase shift between interferograms is obtained by rotating a linear polarizer, generating four interferograms with relative π/2-phase shifts; this simplifies the number of phase steps necessary to retrieve the optical phase, since is only necessary perform a shift operating a linear polarizer. The optical phase was processed by a four-step algorithm. In order to present the capabilities of the system, results obtained for slope for transparent structures are presented.
机译:在该研究中,我们实现了一种基于两个循环路径耦合干涉仪的两步移位系统,用于透明样品的斜率测量。光学系统产生两个偏移的干扰图,并且通过旋转线性偏振器来获得干扰图之间的相移,从相对π/ 2相移位产生四个干涉图;这简化了检索光学阶段所需的相位步骤的数量,因为仅需要执行操作线性偏振器的换档。通过四步算法处理光学相位。为了呈现系统的能力,提出了用于透明结构坡度的结果。

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