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Characterization Methods of Subsurface Cracks in Grinding of Optical Elements

机译:磨削光学元件砂砾裂缝的特征方法

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In this paper, the subsurface cracks of fused silica introduced in grinding were detected by taper polishing method, and then characterized by the maximum depth, the cluster depth, and the density of cracks. The quantitative relationship between maximum depth and cluster depth of subsurface cracks was determined, and the distribution of subsurface crack density along the depth was studied. The results showed that the abrasive grain size had a great influence on maximum depth and cluster depth of subsurface cracks, while the grinding fluid concentration had little effect on them. The different processing parameters changed maximum depth and cluster depth, but their ratio was almost unchanged. The subsurface crack density decreased exponentially along the depth, and the decrease trend had slowed down significantly at the half of cluster depth.
机译:在本文中,通过锥形抛光方法检测磨削中引入的熔融二氧化硅的地下裂缝,然后通过最大深度,簇深度和裂缝密度的特征。确定了地下裂缝的最大深度和簇深度之间的定量关系,研究了沿深度的地下裂纹密度分布。结果表明,磨料晶粒尺寸对地下裂缝的最大深度和簇深度产生了很大影响,而磨削流体浓度对它们影响不大。不同的处理参数更改了最大深度和群集深度,但它们的比率几乎不变。地下裂缝密度沿深度指数逐渐减少,减少趋势在集群深度的一半中显着放缓。

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