Reliability Modeling of Complex Electronic System Based on Weibull Distribution

摘要

The failure law is not clear in operation of complex electronic system. The failure data can not be effectively used. And it is difficult to assess the current state of the system. This paper proposed a fitting method of failure data based on triple Weibull distribution model for complex repairable long-life-cycle complex electronic system. Triple Welbull modeling method is used to analyze the accumulated operation time of complex electronic system. Maximum likelihood estimation is used to estimate the shape and scale parameters In Weibull distribution. And the specific iterative solution process is given. Using function continuity, the formula for the corresponding triple Weibull distribution is derived. And the key time inflection points and connection parameters are given. The failure data of electronic warfare system is used to analyze and verify the feasibility of the method.