Construction of MRAM reliability test platform

摘要

Magnetic random-access memory(MRAM)is a kind of desirable emerging memory,which promises non-volatility, high storage density, fast access speed and strong radiation resistivity. However, due to the immature fabrication process, reliability is a significant issue for emerging MRAM technology. In the paper, we propose and implement a MRAM reliability test platform and perform a series of tests of MRAM on this platform to evaluate MRAM reliability in terms of temperature variation, and supply voltage variation. The test results dictate the effectiveness of our proposed testing platform and illustrate relevant reliability metrics of current MRAM technology.