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Transfer of ultra-thin semi-conductor films onto flexible substrates

机译:柔性基板上的超薄半导体膜的转移

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摘要

This study describes a process for transferring a 200 nm Si thin film from a SOI onto a flexible substrate. The objective is to find a way for applying a tensile strain onto a very thin semi-conductor film for tensile strain engineering. The processs is achieved with 200 mm wafers and based on a polymer temporary bonding process. Grinding and etching are used for removing the SOI backside substrate and buried oxide. The process leads to a 200 mm Si thin film transferred onto a dicing tape. No crack or ripple is observed on the film and further tensile strain experiments can be conducted on the structure.
机译:该研究描述了一种将来自SOI的200nm Si薄膜转移到柔性基板上的方法。该目的是找到一种方法,用于将拉伸应变施加到用于拉伸应变工程的非常薄的半导体膜上。用200mm晶片实现该方法,并基于聚合物临时粘合过程。研磨和蚀刻用于去除SOI背面基板并掩埋氧化物。该方法导致200mm Si薄膜转移到切割带上。在薄膜上没有观察到裂缝或纹波,并且可以在结构上进行进一步的拉伸应变实验。

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