首页> 外文会议>PRiME Joint International Meeting of the Electrochemical Society, the Electrochemical Society of Japan, and the Korean Electrochemical Society >Schematic Description of the Internal Stress Distribution Responsible for Defect Generation in Larger-Diameter PVT-Grown 4H-SiC Single Crystals
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Schematic Description of the Internal Stress Distribution Responsible for Defect Generation in Larger-Diameter PVT-Grown 4H-SiC Single Crystals

机译:负责较大直径PVT-生长的4H-SiC单晶的缺陷产生的内应力分布的示意性描述

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Growth stability necessary for the realization of larger-diameter PVT-grown SiC crystals with higher crystallinity was discussed from thermoelastic and thermodynamic viewpoints of SiC-PVT single crystal growth phenomena. A schematic interpretation based upon the equilibrium equations was presented for approximated estimation of thermoelastic stresses, and the effects of reactions between the vapor and carbon sources on the SiC growth were examined in the frame work of thermodynamic description for PVT-SiC growth.
机译:从SiC-PVT单晶生长现象的热弹性和热力学观点讨论了实现具有更高结晶度的较高直径pVT生长的SiC晶体所需的生长稳定性。提出了一种基于平衡方程的示意图,用于近似估计热弹性应力,并且在热力学描述的框架工作中研究了PVT-SiC生长的框架工作中的蒸汽和碳源对SiC生长之间的反应的影响。

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