Modelling the Residual Stress Field Ahead of the Notch Root in Shot Peened V-Notched Samples

摘要

The knowledge of the residual stress field in the vicinity of the notch of shot peened fatigue specimens is of paramount importance to understand the fatigue resistance of components carrying stress raisers and subjected to surface treatments aimed at introducing compressive residual stresses. For this purpose, residual stresses were measured along the notch bisector using two experimental techniques, namely micro-XRD and FIB-DIC micro-slot cutting and micro-hole drilling. The measurements were used to reconstruct the residual stress field through FE analyses. The obtained results accord with both experimental techniques and indicate an increasing concentration of the longitudinal residual stress component with increasing sharpness of the notch. The proposed approach can be very useful to estimate the notch fatigue resistance of shot peened component on the basis of local stress and fracture mechanics approaches.