Electron Microscopy Study of Thermoelectric (Bi_xSb_(1-x))_2Te_3 Thin Film

机译：电子显微镜研究热电（Bi_xsb_（1-x））_ 2te_3薄膜

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In the present work, transmission electron microscopy (TEM) techniques were used in order to study the morphology and investigate the structural properties of a (Bi_xSb_(1-x))_2Te_3 (BST) thin film. The sample was fabricated on silicon substrate by pulsed laser deposition (PLD) method. Towards this aim, cross sectional and planar view samples were prepared, suitable for High Resolution Electron Microscopy. Results revealed a polycrystalline, c-axis oriented film with coherent boundaries between neighboring columnar grains.

机译：在本作工作中，使用透射电子显微镜（TEM）技术来研究形态并研究A（Bi_XSB_（1-x））_ 2TE_3（BST）薄膜的结构性质。通过脉冲激光沉积（PLD）方法在硅衬底上制造样品。朝向该目的，制备横截面和平面图样品，适用于高分辨率电子显微镜。结果显示多晶，C轴取向膜，具有相邻柱状晶粒之间的相干边界。

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《International Multidisciplinary Microscopy and Microanalysis Congress》|2015年|xix 262 p.|共5页
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Aikaterini Breza; Christos B. Lioutas; John Giapintzakis;
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中图分类 TH742-532;
关键词
Thermoelectric; TEM; BST;

机译：热电;TEM;BST;

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1. One-step electrochemical preparation of the ternary (Bi_xSb_(1-x))_2Te_3 thin films on Au(1 1 1): Composition-dependent growth and characterization studies [J] . Ibrahim Y. Erdogan, Umit Demir Electrochimica Acta . 2010,第22期

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2. Comparative study of the electrochemical preparation of Bi_2Te_3, Sb_2Te_3, and (Bi_xSb_(1-x))_2Te_3 films [J] . Doriane Del Frari, Sebastien Diliberto, Nicolas Stein, Thin Solid Films . 2005,第1a2期

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3. Effects of composition and preferred orientation on microstructure and thermoelectric properties of p-type (Bi_xSb_((1-x))) _2Te_3 alloys [J] . Euvananont C., Jantaping N., Thanachayanont C. Current applied physics: the official journal of the Korean Physical Society . 2011,第Suppla1期

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4. Electron Microscopy Study of Thermoelectric (Bi_xSb_(1-x))_2Te_3 Thin Film [C] . Aikaterini Breza, Christos B. Lioutas, John Giapintzakis International Multidisciplinary Microscopy and Microanalysis Congress . 2015

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Electron Microscopy Study of Thermoelectric (Bi_xSb_(1-x))_2Te_3 Thin Film

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