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Interferometric microscopy of silicon photonic devices

机译:硅光子器件的干涉显微镜

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Silicon photonics provides the ability to construct complex photonic circuits that act on the amplitude and phase of multiple optical channels. Many applications of silicon photonics depend on maintenance of optical coherence among the various waveguides and structures on the chip. Other applications can depend on the modal structures of the waveguides. All these application require the ability to characterize the amplitude and phase of individual optical channels. Fourier imaging with high numerical aperture microscope objectives has been used to image the intensity of individual channels of photonic structures in both real and Fourier space. In other work, holographic imaging of multimode fibers has allowed modal decomposition. In this work we use interferometric microscopy to image the amplitude and phase of a variety of silicon photonic structures. These include a multimode interference splitter and a multimode waveguide under various excitation conditions.
机译:硅光子学提供了构造作用于多个光学通道的幅度和相位的复杂光子电路的能力。许多硅光子的应用依赖于芯片上各种波导和结构之间的光学相干性的维护。其他应用可以取决于波导的模态结构。所有这些应用程序都需要能够表征各个光学通道的幅度和阶段。具有高数值孔径显微镜目标的傅里叶成像已被用于在真实和傅立叶空间中以对光子结构的各个通道的强度。在其他工作中,多模纤维的全能纤维的全能成像允许模态分解。在这项工作中,我们使用干涉测量显微镜来对各种硅光子结构的幅度和相位进行图像。这些包括在各种激励条件下的多模干干分路器和多模波导。

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