首页> 外文会议>E-MRS Spring Meeting on Advancesd Inorganic Materials and Structures for Photovoltaics >Co-evaporated Tin Sulfide thin films on bare and Mo-coated glass substrates as photovoltaic absorber layers
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Co-evaporated Tin Sulfide thin films on bare and Mo-coated glass substrates as photovoltaic absorber layers

机译:在裸露的玻璃基板上共蒸馏锡硫化物薄膜,作为光伏吸收层

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This work has been focused on the synthesis by co-evaporation on bare and Mo-coated glass substrates of tin sulfide films with thicknesses in the 700-1200 nm range for use as absorber layers, with a substrate temperature at 350 °C and a sulfur partial pressure of 1-2*10~(-3) Pa. After evaporation, the samples were heated at 500 °C under Ar atmosphere. The evolution of the morphological, structural, chemical and optical properties of the samples deposited on bare or Mo-coated glass substrates has been analyzed as a function of the thickness, before and after annealing. For the samples grown on bare glass, some phase mixing has been observed by X-ray diffraction (XRD). Samples with reduced thickness preferably crystallize in the SnS phase, whereas thicker layers crystallize in the Sn2S3 phase. Otherwise, the Mo-coated glass substrate favors the crystallinity in the phase SnS preferably. Scanning electron microscope (SEM) shows thin films with homogeneous and uniform surface. All samples were characterized by reflectance (R) and transmittance (T) measurements in the wavelength range 300-1500 nm, showing an increase of the maxima of reflectance when the films are obtained on bare glass and after annealing. The energy band gap values, calculated from optical measurements of T and R, are between 1.14-1.20 eV, being suitable for absorbers layers in photovoltaic applications.
机译:这项工作已集中在合成由上,其厚度在700-1200纳米范围内用作吸收层硫化锡膜的裸和Mo-涂覆的玻璃基材共蒸发,与基板温度在350℃和硫1-2 * 10〜(-3)PA的分压。蒸发后,将样品在500℃下在Ar气氛下加热。已经分析了沉积在裸露或制造玻璃基板上的样品的形态,结构,化学和光学性质的演变,以作为退火前后的厚度的函数。对于在裸露玻璃上生长的样品,已经通过X射线衍射(XRD)观察了一些相混合。厚度减小的样品优选在SNS相中结晶,而较厚的层在SN2S3相中结晶。否则,Mo涂覆的玻璃基板优选地利用相单位的结晶度。扫描电子显微镜(SEM)显示具有均匀和均匀的表面的薄膜。所有样品的特征在于,通过反射率(R)和波长范围300-1500nm的透射率(t)测量,显示在裸玻璃上获得薄膜和退火后当薄膜获得时的反射率最大值的增加。根据T和R的光学测量计算的能带隙值在1.14-1.20eV之间,适用于光伏应用中的吸收层。

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