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Nanohardness of DC Magnetron Sputtered W-C Coatings as a Function of Composition and Residual Stresses

机译:DC磁控管的纳米型溅射W-C涂层作为组成和残余应力的函数

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摘要

The effects of residual stresses in thin W-C based coatings were investigated with the aim to find their influence on nanohardness and indentation modulus. Ten samples of W-C based coatings were deposited on microslide glass substrates using DC magnetron sputtering at the identical deposition parameters. Their thickness was in the range from 500 to 600 nm. The residual stresses in the coatings varied from 1.5 GPa up to 4.4 GPa. Increase of residual stress caused linear increase of H_(it) from 16 to 19.5 GPa. This increase was only the result of the compressive stresses. E_(IT) of the studied coatings was not sensitive to residual stresses and corresponded to 185 GPa ±15 GPa.
机译:研究了残留应力在薄的W-C基涂层中的影响,目的是探讨它们对纳米术和压痕模量的影响。使用DC磁控溅射在相同的沉积参数下沉积在微玻璃玻璃基板上沉积10个基于W-C涂层的样品。它们的厚度在500至600nm的范围内。涂层中的残余应力从1.5GPa变化,高达4.4GPa。残留应激的增加导致16至19.5GPa的线性增加H_(IT)。这种增加只是压缩应力的结果。研究的涂层的e_(it)对残余应力不敏感,与185gPa±15gPa相对应。

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