Nonlinear optical properties of 0.7(Na_(1/2)Bi_(1/2))TiO_3-0.3(K_(1/2)Bi_(1/2))TiO_3 thin films using Z-scan technique

摘要

Well-crystallized 0.7(Na_(1/2)Bi_(1/2))TiO_3-0.3(K_(1/2)Bi_(1/2))TiO_3 (NKBT) thin films were prepared on quartz substrates using a sol-gel process. The sign and magnitude of both the real and imaginary parts of third-order nonlinear susceptibility X~(3) of the thin films have been determined by the Z-scan technique performed at 532nm with picosecond laser.