首页> 外文期刊>Applied Physicsletters >Piezoresponse and ferroelectric properties of lead-free [Bi_(0.5)(Na_(0.7)K_(0.2)Li_(0.1))_(0.5)]TiO_3 thin films by pulsed laser deposition
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Piezoresponse and ferroelectric properties of lead-free [Bi_(0.5)(Na_(0.7)K_(0.2)Li_(0.1))_(0.5)]TiO_3 thin films by pulsed laser deposition

机译:脉冲激光沉积无铅[Bi_(0.5)(Na_(0.7)K_(0.2)Li_(0.1))_((0.5)] TiO_3薄膜的压电响应和铁电性能

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摘要

Polycrystalline lead-free piezoelectric [Bi_(0.5)(Na_(0.7)K_(0.2)Li_(0.1))_(0.5)]TiO_3 (BNKLT) thin films were grown on Pt/Ti/SiO_2/Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization P_r of 13.9 μC/cm~2 and a coercive field E_c of 10.2 MV/m. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d_(33,f) of the BNKLT thin films was about 64 pm/V.
机译:使用脉冲激光沉积法在Pt / Ti / SiO_2 / Si衬底上生长多晶无铅压电[Bi_(0.5)(Na_(0.7)K_(0.2)Li_(0.1))_(0.5)] TiO_3(BNKLT)薄膜。 (PLD)。在这封信中,我们报告了P​​LD生产的BNKLT薄膜的铁电性能和压电响应。 X射线衍射表征显示了膜中良好的结晶度和纯钙钛矿结构。薄膜表现出清晰的极化磁滞回线,剩余极化P_r为13.9μC/ cm〜2,矫顽场E_c为10.2 MV / m。通过压电响应力显微镜观察了畴结构及其从铁电相到非铁电相的热驱动演化。结果与BNKLT块状陶瓷的相变曲线一致。获得了典型的蝴蝶形压电响应回路,BNKLT薄膜的有效压电系数d_(33,f)为约64 pm / V。

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