A BIST Structure for ADC in Mixed-Signal SOC

摘要

A BIST structure for ADC test in Mixed-Signal SOC to characterize both the dynamic and static parameters was presented. A Sigma-Delta modulation based sinewave generator was built on the chip. The frequency, amplitude and phase of the sinusoidal signal can be adjusted through proper selecting generator parameters which are stored in ADC WBR. The response analyzer was built up from the memory and computational resource in the SOC.