A Fully Automated Method to Create Monte-Carlo MOSFET Model Libraries for Statistical Circuit Simulations

摘要

This paper presents a novel method, Sequential Variation Determination (SVD), to efficiently and automatically determine the required variance for compact model parameters such that the statistical compact model produces the required variances for model output parameters. Unlike previous methods for accomplishing this task, SVD detects inconsistency in the variances and model sensitivities presented. If inconsistency are detected, SVD provides both diagnositic information and makes reasonable adjustment and arrives at a solution.