ASSESSMENT METHOD FOR TECHNOLOGY DEVELOPMENT OF AN INDUSTRIAL CLUSTER BY USING SPATIAL AUTO-CORRELATION OF PATENT APPLICATIONS

摘要

Development of an industrial cluster which means a geographic concentration of interconnected businesses and associated institutions in a particular field is one of most important policy for many countries. One of the 'key issues for promotion of the policy is to use proper assessment method of it. At the present time, some assessment methods based on economic statistics or questionary investigations are proposed. However, the methods based on economic statistics are able to use only long-term assessment. On the other hands, the methods using questionary investigation are including problems on consuming a lot of time and effort. In order to solve the problems, we develop automatic analysis method of geometric bias of patent applications which is able to assess on middle/short-term. As a result, our method can detect the bias on patent applications.