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Reduction of Threading Screw Dislocation Density Utilizing Defect Conversion during Solution Growth of 4H-SiC

机译:利用缺陷转化在4H-SiC溶液生长期间利用缺陷转化的螺纹螺旋位错密度

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Reduction of threading screw dislocation density without polytype transformation from 4H-SiC was performed by the combination of step-flow growth and spiral growth. On a vicinal 4H-SiC seed crystal, threading screw dislocations are converted to Frank-type stacking faults by step-flow during solution growth. As the growth proceeds, the defects are excluded from the crystal. Thus utilizing the conversion, high quality SiC crystal growth without threading screw dislocations is expected to achieve. However, at the same time, polytype transformation was caused by the occurrence of 2D nucleation. By using the special shape of seed crystal, we successfully grew high quality 4H-SiC crystal without threading screw dislocation and polytype transformation.
机译:通过阶跃流量生长和螺旋生长的组合进行了从4H-SiC的没有聚型转化的螺纹螺纹脱位密度的降低。在静脉内4H-SiC晶晶晶体上,在溶液生长期间,通过步进流动转换为弗兰克式堆叠故障。随着增长所需的,缺陷被排除在晶体之外。从而利用转换,预期没有穿线螺旋脱位的高质量SiC晶体生长。但是,同时,多型转化是由2D成核的发生引起的。通过使用种子晶体的特殊形状,我们成功地增长了高质量的4H-SIC晶体而无需螺纹脱位和多型转换。

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