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Closed-loop Control of a SOI-MEMS Resonant Accelerometer with Electromagnetic Excitation

机译:具有电磁激励的SOI-MEMS谐振加速度计的闭环控制

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A closed-loop control system designed for a SOI-MEMS resonant accelerometer is proposed in this paper. The sensor chip was developed by silicon-direct-bonding SOI wafer (10+2+290 um) with MEMS fabrication technology. Z-axis acceleration is differentially detected by using two H-style vibrating beams through a frequency shift caused by the inertial force acting as bending stress loading. The electromagnetically excitation and detection is adopted to make the closed-loop control of the sensor easier. The whole closed-loop control system designed for the accelerometer mainly consists of amplifier, automatic gain control (AGC) circuit, buffer and phase shifter. Testing results show that the accelerometer with the closed-loop system can work stable at the frequency of 58.958 kHz when 1g z-axis acceleration is applied which is consistent with the open-loop testing.
机译:本文提出了一种专为SOI-MEMS谐振加速度计设计的闭环控制系统。传感器芯片由硅直接键合SOI晶片(10 + 2 +290μm)与MEMS制造技术开发。通过使用由发挥作用为弯曲应力负载的惯性力引起的两个H型振动光束来差异地检测Z轴加速度。采用电磁激励和检测来使传感器的闭环控制更容易。为加速度计设计的整个闭环控制系统主要由放大器,自动增益控制(AGC)电路,缓冲和移相器组成。测试结果表明,当施加1G Z轴加速时,带闭环系统的加速度计可以在58.958 kHz的频率下工作,这与开环测试一致。

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