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Within-Clock Power Gating Architecture Implimentation to Reduce Leakage

机译:在时钟内功率门控架构实现,以减少泄漏

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With the technology scaling leakage power has become comparable to dynamic power. Power gating is a technique which is used to reduce standby leakage by shutting down the power supply of the inactive block of the circuit. There is also scope of using power gating in active block to reduce run time leakage. Within clock period there is certain portion which is idle and in this period power gating may be used. In this paper we present this within-clock power gating for minimizing leakage and total power of the sequential circuits during active mode of operation. The technique is used to implement the architecture of ISCAS89 benchmark circuit. Power results have been reported for different frequency. Simulation of the implemented architecture in CADENCE VLSI tool at 45nm technology shows leakage saving of 73% and 54.78% saving in switching compared to the designs without within-clock power gating at 1.25 MHZ.
机译:通过技术缩放漏电功率与动态功率相当。功率门控是一种技术,用于通过关闭电路的非活动块的电源来减少待机泄漏。在活动块中使用功率门控的范围,以减少运行时间泄漏。在时钟周期内,存在某些部分是空闲的,并且在该时段中可以使用功率门控。在本文中,我们介绍了在激活操作模式期间最小化漏电和顺序电路的泄漏和总功率的钟表功率。该技术用于实现ISCAS89基准电路的体系结构。报告了不同频率的功率结果。 45nm技术的Cadence VLSI工具中实施架构的仿真显示出漏电节省73%和54.78%,与设计时,切换相比节省了4.25 MHz。

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