Thermal Annealing Effect on P3HT:PCBM Free Polarons Lifetime and Charge Transport

摘要

A transient response technique has been employed to investigate the lifetime of free polarons in bulk heterojunction blends of regioregular poly (3-hexylthiophene) (P3HT) and [6,6]-phenyl-C61 butyric acid methylester (PCBM) at different annealing temperatures. Device efficiency and charge mobility were also measured. The longest lifetime, ～ 1.5 microseceonds, was achieved for an annealing temperature of 140°C; this represents a 2.5 x increase in lifetime relative to unannealed samples. The 140°C annealing temperature also yields the highest efficiency. These measurements provide an estimate of the mobility-lifetime product, a figure of merit for charge transport in organic bulk heterojunctions.