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Thermal conductivity measurement of densified Carbon Nanotube bundles by Pulsed Photothermal Reflectance technique

机译:脉冲光热反射技术致密碳纳米管束的热导电测量

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Carbon nanotubes (CNTs) were proposed as a promising interconnection material in future miniaturized electronics, owing to their exceptional electrical and thermal properties. A series of CNT bundles with 1 mm diameter were grown on silicon substrate by thermal Chemical Vapor Deposition (CVD) at temperature 700°C. The as grown CNT bundles were densified by a vapor densification method. SEM analysis shows that the vapor densification is densified the CNT forests, which reduces the air volume fraction to increase thermal conductivity of the CNT bundles. The pulsed photothermal reflectance technique is applied to measure thermal conductivity of the CNT bundle before and after densification and the results show the thermal conductivity of densified CNT bundles increases and capability of making CNT filled through silicon via with better thermal and electrical performance.
机译:由于其特殊的电气和热性质,提出了未来小型化电子中有前途的互连材料的碳纳米管(CNT)。通过温度700℃的热化学气相沉积(CVD)在硅衬底上生长一系列具有1mm直径的CNT束。通过蒸汽致密化方法致密化作为生长的CNT束。 SEM分析表明,蒸汽致密化致密于CNT林,这降低了空气体积分数以增加CNT束的导热率。施加脉冲光热反射率技术以测量致密化之前和之后的CNT束的导热率,结果显示致密化CNT束的导热率增加和通过硅填充的CNT通过更好的热和电气性能。

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