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Comparison of a Scanning Interferometric Profile Measurement Method and an Ultra-Precise Coordinate Measuring Machine

机译:扫描干涉轮廓测量方法的比较和超精密坐标测量机

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Comparative profile measurements of a test specimen with a diameter of 150 mm and a peak-to-valley height of 50 (mu)m carried out by an ultra-precise coordinate measuring machine (Panasonic UA3P) and a highly accurate scanning interferometric multi-sensor instrument (ETMS) are presented. The instruments and their principles are described. Although the measurement principles of the instruments are different, the measurements agree within the claimed uncertainties. The rms-difference of the measurement results is less than 20 nm.
机译:通过超精密坐标测量机(Panasonic UA3P)和高精度扫描干涉器多传感器,对直径为150mm的测试样品和50(mu)m的峰 - 谷高度的比较轮廓测量介绍了仪器(ETMS)。描述了仪器及其原则。虽然仪器的测量原则不同,但测量结果在索赔的不确定性内同意。测量结果的RMS差异小于20nm。

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