Comparability of RF immunity test methods for IC design purposes

摘要

The differences between DPI and BCI tests in automotive IC-immunity testing are analysed. An approach, how to transfer results between the methods is shown on the example of a simple analogue IC. High conformity of the results for both tests (DPI and BCI) can be observed. The virtual RF immunity test is described, where the detailed modelling of the test setups is avoided and only the nearest IC environment (PCB and IC package) are modelled with high accuracy. The test can easily be implemented during the design process, and thus the reliability of the designed ICs can be significantly improved.