Reliability evaluation on 100W QCW-AlGaAs/GaAs 808nm cm-bars

摘要

Degradation performance and lifetimes of high power laser diodes are important issues for laser manufacturers and end users. To fully understand these issues we have set up a computer controlled diode array reliability experiment which can automated monitor the laser bars 24 hours a day. Subsequent two different temperatures aging tests were completed, according to the aging results we obtained an acceleration factor 1.88 of resulting in a thermal activation energy of E_a=0.21eV. Finally, the detailed failure analysis for the failed devices and its influence on reliability were reported on this paper.