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Impact of Process Mechanical Simulation Methodology on Electronic Package Reliability Assessment

机译:工艺机械仿真方法对电子包装可靠性评估的影响

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Mechanical reliability issues in electronic package have drawn significant attention in semi-conductor industry for decades and have increased product development cost significantly. Recent rapid growth of various portable electronic devices like netbook and smartbook with increasing demand for more functionality in tighter space further challenges the limit of mechanical reliability. To reduce the product development cost and time-to-market, mechanical simulation has been extensively employed across semiconductor industry for the purpose of design optimization and reliability assessment. The importance of having the correct simulation methodology can?ˉt be overemphasized considering the extent of its utilization throughout the whole product development cycle. In this paper, we will discuss three fundamental mechanical modeling methodologies that are widely used for flip-chip overmolded packages in the industry. The first approach is to assume whole package is stress-free initially at a given uniform temperature, which is usually the peak temperature of the mold cure profile. However, this differs from the actual assembly process where reflow or cure temperature profiles are different at each process step. The second approach takes that into account and assigns different initial stress-free temperature to different package component. The last approach explores that idea further by simulating the actual assembly process, step by step through element removal and addition in the model. Details of each procedure are outlined in the paper. Package End of Line (EOL) warpage predictions from these models on a real device are compared and validated with shadow or data. Reliability assessment regarding different failure mechanism based on these three modeling methodology is also included. Finally, we will share our recommendation and highlight the advantage/disadvantage of each modeling methodology. These statements do not reflect opinions from Qualcomm Inc. All data shared in this paper will be screened such that no confidential information is published or presented.
机译:电子包装中的机械可靠性问题几十年来,在半导体行业中引起了显着的关注,并提高了产品开发成本明显。近期各种便携式电子设备等各种便携式电子设备,如上网本和智能本,在更严格的空间中对更多功能的需求越来越大,进一步挑战机械可靠性的极限。为降低产品开发成本和上市时间,机械模拟在半导体行业广泛使用,以设计优化和可靠性评估。考虑到整个产品开发周期的利用程度,具有正确的模拟方法的重要性可以封闭。在本文中,我们将讨论三种基本机械建模方法,这些方法广泛用于行业中的倒装芯片超模包。第一种方法是假设整个包装最初在给定的均匀温度下无应力,这通常是模具固化曲线的峰值温度。然而,这与实际组装过程不同,其中在每个过程步骤中回流或固化温度谱不同。第二种方法考虑到该方法并为不同的包装分配给不同的初始压力温度。最后一个方法通过模拟实际装配过程,通过模型中的元素删除和添加来进一步探讨该想法。本文概述了每个程序的细节。比较和验证来自这些模型的线路(EOL)旋转线(EOL)翘曲预测,并用阴影或数据验证。还包括基于这三种建模方法的不同故障机制的可靠性评估。最后,我们将分享我们的建议并突出每个建模方法的优势/缺点。这些陈述不反映来自Qualcomm Inc.的意见。本文共享的所有数据将被筛选,以便未公布或提供保密信息。

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