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Resist Technology - Recent Progress and Future Prognosis

机译:抗拒技术 - 最近进展和未来预后

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Resist is meeting current targets for resolution and is close in photospeed thanks to many innovations and progress in resist chemistry and processing. There are promising avenues for further improvement of resist that are now in the research stage. LWR and CDU will continue to be a problem that needs to be mitigated or managed. Post processing is likely to be needed to meet requirements. Longer term, slower resists may be more optimal as EUV power sources improve.
机译:由于许多创新和抗拒化学和加工进展,抵制正在满足目前的分辨率,并且在照片中接近照片。有希望的途径,以进一步提高现在在研究阶段的抵制。 LWR和CDU将继续成为需要减轻或管理的问题。可能需要发布后处理来满足要求。随着EUV电源的改善,较慢的抗蚀剂可能更加最佳。

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