An Introduction to Inelastic X-Ray Scattering

摘要

The article provides a brief but up-to-date overview of inelastic X-ray scattering (IXS), a powerful spectroscopic probe of the electronic and dynamical properties. We introduce in first part the basic theoretical concepts for both resonant and nonresonant IXS, including resonant X-ray emission, absorption in the partial fluorescence yield mode, and X-ray Raman scattering. This formal section is fol-lowed by examples borrowed from the recent literature, with an emphasis on high pressure physics, strongly correlated materials, and new instrumentation.