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SIC pair generation in near-optimal time with carry-look ahead adders

机译:SiC对在近乎最佳时间内的一代,携带携带的前瞻加美

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Single Input Change (SIC) pairs, are pairs of patterns where exactly one bit flips between the two patterns of the pair and are valuable for the detection of robustly detectable stuck-open and delay faults. Therefore, the on-chip generation of SIC pairs has gained attention from a number of researchers. Previous schemes targeting the generation of SIC pairs utilizing adders affect the critical path of the adder, altering the timing characteristics of the circuit. In this paper a novel SIC pair generator is presented, based on a carry-look ahead adder. The proposed scheme imposes no intervention on the critical path of the adder, therefore its timing characteristics are not affected.
机译:单个输入改变(SiC)对,是一对图案,其中恰好在该对的两个图案之间翻转,并且对于检测鲁棒性可检测的粘滞和延迟故障是有价值的。因此,SiC对的片上生成已从许多研究人员中获得了关注。以前的方案针对使用添加剂的SiC对的生成影响加法器的临界路径,改变电路的定时特性。在本文中,呈现了一种新颖的SiC对发生器,基于携带护套加法器。该方案对加法器的临界路径施加干预,因此其定时特性不受影响。

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