Computer Simulation and Depth Profiling of Light Nuclei by Nuclear Techniques

摘要

This article involves computer simulation and surface analysis by nuclear techniques, which are non-destructive. The "energy method of analysis" for nuclear reactions and elastic scattering is used. Energy spectra are computer simulated and compared with experimental data, giving target composition and concentration profile information. The method is successfully applied to depth profiling of 18{sup left}O and 12{sup left}C nuclei in thick targets through the 18{sup left}O(p,α{sub}0)15{sup left}N and 12{sup left}C(d,p{sub}0)13{sup left}C reactions, respectively. Similarly, elastic scattering of (4{sup left}He){sup}+ ions is applied to determination of concentration profiles of O and Al for a thick target containing a thin film of aluminium oxide.