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Epitaxial Regrowth of Silicon for the Fabrication of Radial JunctionNanowire Solar Cells

机译:硅的外延再生,用于制造径向结南风太阳能电池

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Radial p-n silicon nanowire (SiNW) solar cells are of interest as a potential pathway to increase the efficiency of crystalline silicon photovoltaics by reducing the junction length and surface reflectivity. Our studies have focused on the use of vapor-liquid-solid (VLS) growth in combination with chemical vapor deposition (CVD) processing for the fabrication of radial p-n junction SiNW array solar cells. High aspect ratio p-type SiNW arrays were initially grown on gold-coated (111) Si substrates by CVD using SiCl_4 as the source gas and B2H6 as the p-type dopant source. The epitaxial re-growth of n-type Si shell layers on the Si nanowires was then investigated using SiH_4 as the source gas and PH3 as the dopant. Highly conformal coatings were achieved on nanowires up to 25 μm in length. The microstructure of the Si shell layer changed from polycrystalline to single crystal as the deposition temperature was raised from 650°C to 950°C. Electrical test structures were fabricated by aligning released SiNWs onto pre-patterned substrates via field-assisted assembly followed by selective removal of the n-type shell layer and contact deposition. Current-voltage measurements of the radial p-n SiNWs diodes fabricated with re-grown Si shell layers at 950°C demonstrate rectifying behavior with an ideality factor of 1.93. Under illumination from an AM1.5g spectrum and efficiency for this single SiNW radial p-n junction was determined to be 1.8%, total wire diameter was 985 nm.
机译:径向P-N硅纳米线(SINW)太阳能电池作为潜在的途径,通过降低结长度和表面反射率来提高晶体光伏电极的效率。我们的研究专注于使用汽液 - 固体(VLS)生长与化学气相沉积(CVD)加工结合制造径向P-N结Sinw阵列太阳能电池。高纵横比P型SINW阵列最初通过CVD在金涂覆的(111)Si底物上以CVD使用SiCl_4作为源气体和B2H6作为p型掺杂剂源。然后使用SiH_4作为源气体和pH3作为掺杂剂,研究了Si纳米线上的N型Si壳层的外延再生。在纳米线上达到高达25μm的高度保形涂层。随着沉积温度从多晶体变为单晶的Si壳层的微观结构从650℃至950℃升高。通过将释放的SINWS对准通过现场辅助组件将释放的SINW对准,然后选择性地去除N型壳层并接触沉积来制造电试验结构。 950℃的重新种植Si壳层制造的径向P-N Sinws二极管的电流 - 电压测量结果证明了具有1.93的理想因子的整流行为。在从AM1.5G的照明中,对于该单一的SINW径向P-N结的频谱和效率测定为1.8%,总线直径为985nm。

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