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Neutron Transmutation Doping and Radiation Hardness for Solution-Grown Bulk and Nano-Structured ZnO

机译:中子嬗变掺杂和溶液生长和纳米结构ZnO的辐射硬度

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It is shown that solution-grown ZnO nanostractures exhibit enhanced radiation hardness against neutron irradiation as compared to bulk material. The decrease of the cafhodoluminescence intensity after irradiation at a neutron dose of 6 × 10~(16) cm~(-2) in ZnO nanqstructure is nearly identical to that induced by a dose of 1.5 ×10~(14) cm~(-2) in bulk material. The damage introduced by irradiation is shown to change the nature of electronic transitions responsible for luminescence. The change of excitonic luminescence to the luminescence related to the tailing of the density of states caused by potential fluctuations occurs at an irradiation dose around 6×10~(16) cm~(-2) and 5×10~(14) cm~(-2) in nanostructured and bulk materials, respectively. Hall measurements before and after annealing determined the effect of dose on resistance, mobility, and carrier concentration. Annealing decreased the sheet resistance, increased the mobility, and increased carrier concentration for all doses. While the concentration of carriers in the control sample increased 200-fold after annealing, the increase was ~1000-fold for the irradiated samples. Annealed irradiated samples showed a maximum carrier concentration increase of about 60x over the unirradiated sample. Interestingly, neutron irradiation increased the mobility even in the un-annealed samples.
机译:结果表明,与散装材料相比,溶液生长的ZnO纳米纳米分量表现出增强的辐射硬度抵抗中子辐射。在ZnO Nanqubrary的中子剂量下照射后的CaFhodol发光强度的降低几乎与诱导的1.5×10〜(14)cm〜( - 2)在散装材料中。辐照引入的损坏显示,改变负责发光的电子转换性质。在潜在波动引起的潜在波动引起的潜在波动引起的透射剂相关的发光的变化发生在辐照剂量约为6×10〜(16)cm〜(-2)和5×10〜(14)cm〜 (-2)分别为纳米结构和散装材料。退火前后的霍尔测量确定剂量对抗性,迁移率和载体浓度的影响。退火减少了薄层电阻,增加了迁移率,并增加了所有剂量的载体浓度。虽然在退火后对照样品中载体的浓度增加了200倍,但是辐照样品的增加为约1000倍。退火的辐照样品显示在未照射的样品上最大的载体浓度增加约60倍。有趣的是,即使在未退火的样品中,中子辐射也会增加流动性。

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