首页> 外文会议>SPIE Optics Photonics Conference on Plasmonics: Nanoimaging, Nanofabrication, and their Applications >Loss monitoring in resonant photon tunneling through metaland dielectric multi-layer metamaterials
【24h】

Loss monitoring in resonant photon tunneling through metaland dielectric multi-layer metamaterials

机译:通过Metal和介电多层超材料谐振光子隧穿的损失监测

获取原文
获取外文期刊封面目录资料

摘要

Loss is a critical parameter in metamaterials because it determines the resolution of a super-lens made of meta-materials. The super-lensing effect observed in alternative multi-layer metamaterials consisting of metal and dielectric layers is derived from the resonant photon tunneling (RPT) via surface plasmon polaritons (SPPs). Here we demonstrates that the losses in the metamaterials can be estimated by simultaneous measurements of attenuated total reflection (ATR) and RPT. RPT through silver (Ag)/Si02 metamaterials is studied experimen-tally. A shift of the RPT peak away from the ATR dip is observed; the shift variation in an Ag/SiO_2 system is smaller than that in an aluminum/MgF_2 system. This indicates that the shift is caused by the imaginary part of permittivity, i.e., intrinsic losses, of metamaterials.
机译:损失是超材料中的关键参数,因为它决定了由元材料制成的超镜头的分辨率。在由金属和介电层组成的替代多层超材料中观察到的超镜头效应来自通过表面等离子体极性恒(SPP)的谐振光子隧道(RPT)。在这里,我们证明了超材料中的损失可以通过同时测量减弱的总反射(ATR)和RPT来估计。通过Silver(AG)/ Si02超材料进行RPT通过Silver(AG)/ Si02超材料。观察到RPT峰值远离ATR DIP的偏移; AG / SIO_2系统中的换档变化小于铝/ MGF_2系统中的变化。这表明偏移是由介电常数的虚构部分引起的,即超材料的内在损失。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号