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Temperature-Dependent PL Intensity in FLA-Synthesized and Hydrogen-Modified Silica Layers with Silicon Nanocrystals

机译:用硅纳米晶体的FLA合成和氢气改性二氧化硅层中的温度依赖性PL强度

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The temperature dependence of the photoluminescence intensity I in flash-lamp-anneal-synthesized silica layers with small silicon nanocrystals (nc's) and in similar layers heat-treated in hydrogen-(H-) rich ambient was used to examine how H treatments affect the "dark" fracture of nc's and the migration paths of optically induced excitations in such systems. It can be inferred from the data obtained that the fracture of "dark" nc's in the systems of interest is generally not large, hydrogen weakly passivates defects in small-size nc's, and the influence of H treatments on the parameters governing the temperature dependence of I is insignificant.
机译:光致发光强度I在具有小硅纳米晶体(Nc)的闪光 - 退火合成的二氧化硅层中的温度依赖性和在氢气 - (H-)富含环境中热处理的类似层数,以检查H处理如何影响NC的“暗”骨折和这种系统中光学诱导激发的迁移路径。可以从获得的数据推断出“暗”NC在感兴趣的系统中的骨折通常不大,氢弱钝化小尺寸NC的缺陷,以及H治疗对控制温度依赖性的参数的影响我是微不足道的。

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