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70nm Resolution in Sub-Surface Two-Photon Optical Beam Induced Current Microscopy through Pupil-Function Engineering in the Vectorial Focusing Regime

机译:70nm分辨率在子表面二光子光束诱导电流显微镜通过瞳孔函数工程在矢量聚焦方案中

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摘要

We present experimental evidence for the resolution-enhancing effect of an annular pupil-plane aperture in two-photon semiconductor microscopy in the vectorial-focusing regime. At an illumination wavelength of 1550nm we achieved a resolution of 70nm (λ/22).
机译:我们在矢量聚焦方案中提高了环形半导体显微镜中的环形瞳孔平面孔径的分辨率的实验证据。在1550nm的照明波长下,我们实现了70nm(λ/ 22)的分辨率。

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