Optical Phase Measurements During fs-Processing of Materials Using Time-resolved White-light Interferometry

机译：使用时间分辨的白光干涉测量在物料的FS处理期间光学相位测量

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摘要

Fs-laser induced modifications of glasses and metals are investigated in situ by means of time-resolved white-light interferometry. The optical phase shift and corresponding refractive index change is calculated from the interference images.

机译：通过时间分辨的白光干涉测量来研究FS-Laser诱导的眼镜和金属的修饰。从干扰图像计算光学相移和相应的折射率变化。

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《Conference on Lasers and Electro-Optics Quantum Electronics and Laser Science Conference》|2009年||共2页
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I. Mingareev; D. Wortmann; A. Brand; A. Horn;
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中图分类 TN24-53;
关键词
Imaging ultrafast phenomena; Ultrafast phenomena;

机译：成像超快现象;超薄现象;

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专利

1. Development of a time-resolved white-light interference microscope for optical phase measurements during fs-laser material processing [J] . Alexander Horn, Dirk Wortmann, Andreas Brand, Applied Physics . 2010,第2期

机译：开发时间分辨的白光干涉显微镜，用于在fs激光材料加工过程中进行光学相位测量
2. Development of a time-resolved white-light interference microscope for optical phase measurements during fs-laser material processing [J] . Alexander Horn, Dirk Wortmann, Andreas Brand, Applied Physics A: Materials Science & Processing . 2010,第2期

机译：开发时间分辨的白光干涉显微镜，用于在fs激光材料加工过程中进行光学相位测量
3. Measurement of the optical dielectric properties of thin-film materials by ultrafast time-resolved interferometry [J] . Hai-Ying Song, Peng Wang, Qi-Ni Ge, Results in Physics . 2020,第60期

机译：通过超快时间分辨干涉测量测量薄膜材料的光学介电性能
4. Optical Phase Measurements During fs-Processing of Materials Using Time-resolved White-light Interferometry [C] . I. Mingareev, D. Wortmann, A. Brand, Conference on Lasers and Electro-Optics Quantum Electronics and Laser Science Conference . 2009

机译：使用时间分辨的白光干涉测量在物料的FS处理期间光学相位测量
5. Time-resolved lattice measurements of shock-induced phase transitions in polycrystalline materials. [D] . Milathianaki, Despina. 2010

机译：时间分辨的晶格测量，用于测量多晶材料中的冲击诱导相变。
6. X-ray-induced reduction of Au ions in an aqueous solution in the presence of support materials and in situ time-resolved XANES measurements [O] . Yuji Ohkubo, Takashi Nakagawa, Satoshi Seino, -1

机译：在支持材料存在下X射线诱导的水溶液中金离子的还原和原位时间分辨XANES测量
7. Development of a time-resolved white-light interference microscope for optical phase measurements during fs-laser material processing [O] . Horn, Alexander, Wortmann, Dirk, Brand, Andreas, 2010

机译：开发时间分辨的白光干涉显微镜，用于在fs激光材料加工过程中进行光学相位测量

Optical Phase Measurements During fs-Processing of Materials Using Time-resolved White-light Interferometry

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