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Early estimation of TSV area for power delivery in 3-D integrated circuits

机译:三维集成电路电力输送的TSV区域的早期估计

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To harness the full potential of 3-D integrated circuits, analysis tools for early design space exploration are needed. Such tools, targeting multiple design facets and cost trade-off analysis, would allow designers to arrive at major decisions regarding architecture and implementations fabrics. We focus in this paper on the efficient estimation of on-chip power delivery requirements consistent with supply noise limits. We propose a number of algorithms to find the minimum number of through-silicon vias (TSVs) that deliver power with acceptable IR drops. Minimizing the number of TSVs reduces the total silicon die area which is the main recurring cost during fabrication. To compute the TSV requirements realistically, we utilize power traces derived from benchmark-based functional behavior of processors. To speed-up our simulations, we develop a trace selection technique that utilizes the relevant portion of power traces representing the worst load for IR drops. The trace selection scheme reduces the number of simulations by 51×. Using these traces we find the best spatial allocation of TSVs for a 3-D implementation of a processor. The iterative algorithm can be run in approximately one hour on a 40-processor cluster.
机译:为了利用3-D集成电路的全部潜力,需要进行早期设计空间勘探的分析工具。这些工具,针对多种设计方面和成本权衡分析,允许设计人员到达有关建筑和实施面料的主要决策。我们专注于与供应噪声限制一致的片上电力输送要求的有效估计。我们提出了许多算法来找到通过可接受的IR滴输送功率的最小硅通孔(TSV)。最小化TSV的数量减少了在制造过程中是主要经常性成本的总硅模具区域。为了实际计算TSV要求,我们利用了从处理器的基于基准的功能行为导出的电力迹线。为了加快我们的模拟,我们开发了一种跟踪选择技术,该技术利用代表IR滴的最差负载的电力迹线的相关部分。跟踪选择方案将模拟数量减少51×。使用这些痕迹,我们找到了用于处理器的3-D实现的TSV的最佳空间分配。迭代算法可以在40处理器集群上大约一小时内运行。

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