Investigating the possibilities of compensating systematic errors of three-coordinate touch probes using contact signal

摘要

During inspection with three-coordinate touch probes, working on the principle of a kinematic resistance system, the total measuring error called backlash has a negative effect on the measurement accuracy. In order to eliminate the effect of backlash, many companies offer various solutions. As an alternative solution, a new system with improved design of the touch probe and is based on the principle of electrical contacts has been developed. The capabilities and limitations of this new touch probe are analysed in this paper. It is shown that the improved design can reduce the fluctuation of the dislodging force caused by the change of the direction of the force, and the addition of the contact system makes it possible to define the systematic measurement errors.