Development of a Negative Hydrogen Ion Source for Spatial Beam Profile Measurement of a High Intensity Positive Ion Beam

摘要

We have been developing a negative hydrogen ion (H~? ion) source for a spatial beam profile monitor of a high intensity positive ion beam as a new diagnostic tool. In case of a high intensity continuous‐wave (CW) deuteron (D~+) beam for the International Fusion Materials Irradiation Facility (IFMIF), it is difficult to measure the beam qualities in the severe high radiation environment during about one‐year cyclic operation period. Conventional techniques are next to unusable for diagnostics in the operation period of about eleven months and for maintenance in the one‐month shutdown period. Therefore, we have proposed an active beam probe system by using a negative ion beam and started an experimental study for the proof‐of‐principle (PoP) of the new spatial beam profile monitoring tool. In this paper, we present the status of development of the H~? ion source as a probe beam source for the PoP experiment.