The Effect of Oxygen Annealing on the Resistance Switching Properties of the La{sub}(0.7)Ca{sub}(0.3)MnO{sub}3 Films

摘要

A series of La{sub}(0.7)Ca{sub}(0.3)MnO{sub}3 films are fabricated by pulsed laser deposition under controlling the oxygen partial pressure or adding an oxygen post-annealing process. The film after oxygen post-annealing shows an orientation change and has more non-lattice oxygen near the surface than those of the films without annealing. Moreover, only the structure of Ag/La{sub}(0.7)Ca{sub}(0.3)MnO{sub}3/Pt with the oxygen annealed film behaves a big current-voltage hysteresis and stable resistance switching properties by applying voltage pulse. Experimental results indicate that the increase of non-lattice oxygen content induced by oxygen annealing in the vicinity of the La{sub}(0.7)Ca{sub}(0.3)MnO{sub}3 interface contributes to the occurrence of resistance switching. And with the accurate controlling of the oxygen annealing parameters, the improvement of resistance switching property of the La{sub}(0.7)Ca{sub}(0.3)MnO{sub}3 film can be expected.