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FIB/TEM investigation of Si accumulation in the active layer of SOECs

机译:Si积分在规格中的SI积累的FIB / TEM调查

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This study aimed at revealing and examining degradation processes in solid oxide electro-lyser cells (SOECs) that were operated under working conditions. The investigation specialised in the examination of structural and chemical processes at the electrolyte / fuel electrode interface by means of electron-probe microanalysis (EPMA), transmission electron microscopy (TEM) and energy-dispersive X-ray spectroscopy (EDX). In particular, the Si accumulation at the triple-phase boundaries in the active layer of the fuel electrode was closely examined since this accumulation is considered to play an important role in the degradation of the examined SOECs.
机译:该研究旨在揭示和检查在工作条件下操作的固体氧化物电溶剂筛(SOEC)中的降解过程。通过电子探针微分析(EPMA),透射电子显微镜(TEM)和能量分散X射线光谱(EDX)专门研究电解质/燃料电极接口在电解质/燃料电极接口处的结构和化学过程的研究。特别地,在燃料电极的有源层中的三相边界处的Si累积被密切检查,因为认为该积聚在所检查的SOECS的降解中起重要作用。

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