OXYGEN DIFFUSION IN Bi2O3

摘要

The ~(18)O/~(16)O Isotope Exchange Depth Profile technique (IEDP) was applied to pure Bi2O3 to determine the surface exchange coefficient and bulk oxygen tracer diffusion coefficient. The isotope concentration profiles, obtained by secondary ion mass spectrometry (SIMS), revealed values of D in the order of 1.37x10~(-11) cm~2/sec and k = 4.7x10~(-9) cm/sec at 500 °C and D = 8 x 10~(-11) cm~2/sec and k = 3.2 x 10~(-8) at 600 °C. Possible grain boundary diffusion phenomena are examined.^