首页> 外文会议>International Conference of Nitride Semiconductors >Improvement of surface roughness and reduction of threading dislocation density in AIN/AIGaN templates on sapphire by employing trimethylaluminum pulsed supply growth
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Improvement of surface roughness and reduction of threading dislocation density in AIN/AIGaN templates on sapphire by employing trimethylaluminum pulsed supply growth

机译:通过采用三甲基铝脉冲供应生长改善AIN / AIGAN模板的表面粗糙度和螺纹脱位密度的降低

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We fabricated high-quality AIN/AIGaN templates, which are applicable to ultraviolet (UV) emitters on sapphire, by using a trimethylaluminum (TMAI) pulsed-supply growth method. We succeeded in achieving a dramatic improvement in the surface roughness of AIN/AIGaN layer by introducing a short-period pulsed supply of TMAI during the growth inter-vals of a 'standard' AIGaN growth regime. We speculate that the improvement in surface roughness is due to the realization of stable group III (+c) polarity by the growth of an Al-rich surface. In addition, we have found that this method is effec-tive for reducing threading dislocation densities (TDD). The TDD was reduced from 2.9× 10~9 to 1.1 × 10~9 cm~(-2) by introducing the TMAI pulsed supply growth. We fabricated a 350 nmband InAlGaN multi-quantum well (MQW) UV light-emitting diode (LED) on an AIN/AIGaN template formed by the TMAI pulsed supply method, and obtained an output power of 1.95 mW under room temperature (RT) CW operation. The output power of the LED was increased by a factor of 1.7 by introducing the TMAI pulsed supply method.
机译:我们通过使用三甲基铝(TMAI)脉冲供应生长方法,制造了高品质的AIN / AIGAN模板,其适用于蓝宝石上的紫外(UV)发射器。我们通过在“标准”AIGAN生长制度的生长间隔期间通过引入TMAI的短时间脉冲供应来实现AIN / AIGAN层的表面粗糙度的显着改善。我们推测,表面粗糙度的改善是由于通过富含Al的表面的生长来实现稳定的III(+ C)极性。此外,我们发现该方法是用于减少线程位错密度(TDD)的有效性。通过引入TMAI脉冲供应生长,TDD从2.9×10〜9至1.1×10〜9cm〜(2)减少。我们在由TMAI脉冲供应方法形成的AIN / AIGAN模板上制造了一个350nmBAND inalGAN多量子阱(MQW)UV发光二极管(LED),并在室温(RT)CW下获得1.95mW的输出功率手术。通过引入TMAI脉冲供应方法,LED的输出功率增加了1.7因子。

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